TY  - RPRT
TI  - Modeling Practical Capacitive Structures for Electronic and Dielectric Property Extraction and Analysis
AU  - James G. Champlain
AU  - Vikrant J. Gokhale
AU  - Matthew T. Hardy
AU  - Eric N. Jin
PY  - 2025
DO  - 10.1109/access.2025.3597894
UR  - https://arxiv.org/abs/2503.20961
ID  - 2503.20961
ER  -