TY  - RPRT
TI  - One Look is Enough: Seamless Patchwise Refinement for Zero-Shot Monocular Depth Estimation on High-Resolution Images
AU  - Byeongjun Kwon
AU  - Munchurl Kim
PY  - 2025
UR  - https://arxiv.org/abs/2503.22351
ID  - 2503.22351
ER  -