TY  - RPRT
TI  - Accelerating Surface Composition Characterization of Thin-Film Materials Libraries using Multi-Output Gaussian Process Regression
AU  - F. Thelen
AU  - F. Lourens
AU  - A. Ludwig
PY  - 2025
DO  - 10.1002/aidi.202500062
UR  - https://arxiv.org/abs/2503.23471
ID  - 2503.23471
ER  -