TY  - RPRT
TI  - Low-energy electron microscopy as a tool for analysis of self-assembled molecular layers on surfaces
AU  - Jan Čechal
AU  - Pavel Procházka
PY  - 2025
DO  - 10.1088/1361-648x/ade946
UR  - https://arxiv.org/abs/2503.24174
ID  - 2503.24174
ER  -