TY  - RPRT
TI  - A dual-scale stochastic analysis framework for creep failure considering microstructural randomness
AU  - Weichen Kong
AU  - Yanwei Dai
AU  - Xiang Zhang
AU  - Yinghua Liu
PY  - 2025
UR  - https://arxiv.org/abs/2504.00507
ID  - 2504.00507
ER  -