@misc{indiciae83fc2bd33c22,
  title = {Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers},
  author = {Faisal Mohammad and Duksan Ryu},
  year = {2025},
  url = {https://arxiv.org/abs/2504.02494},
  note = {Source identifier: 2504.02494}
}