@misc{indiciae5f470332b177,
  title = {A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement},
  author = {Yuibi Gomi and Akira Sato and Waleed Madany and Kenichi Okada and Satoshi Adachi and Masatoshi Itoh and Masanori Hashimoto},
  year = {2025},
  doi = {10.1109/lssc.2025.3589611},
  url = {https://arxiv.org/abs/2504.08305},
  note = {Source identifier: 2504.08305}
}