TY  - RPRT
TI  - A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
AU  - Yuibi Gomi
AU  - Akira Sato
AU  - Waleed Madany
AU  - Kenichi Okada
AU  - Satoshi Adachi
AU  - Masatoshi Itoh
AU  - Masanori Hashimoto
PY  - 2025
DO  - 10.1109/lssc.2025.3589611
UR  - https://arxiv.org/abs/2504.08305
ID  - 2504.08305
ER  -