@misc{indiciae079ea297051f,
  title = {Masked Autoencoder Self Pre-Training for Defect Detection in Microelectronics},
  author = {Nikolai Röhrich and Alwin Hoffmann and Richard Nordsieck and Emilio Zarbali and Alireza Javanmardi},
  year = {2025},
  url = {https://arxiv.org/abs/2504.10021},
  note = {Source identifier: 2504.10021}
}