@misc{indiciaeb0bb475721c4,
  title = {Conformal Segmentation in Industrial Surface Defect Detection with Statistical Guarantees},
  author = {Cheng Shen and Yuewei Liu},
  year = {2025},
  url = {https://arxiv.org/abs/2504.17721},
  note = {Source identifier: 2504.17721}
}