TY  - RPRT
TI  - Co-Change Graph Entropy: A New Process Metric for Defect Prediction
AU  - Ethari Hrishikesh
AU  - Amit Kumar
AU  - Meher Bhardwaj
AU  - Sonali Agarwal
PY  - 2025
UR  - https://arxiv.org/abs/2504.18511
ID  - 2504.18511
ER  -