TY  - RPRT
TI  - In situ measurement of electrical resistivity evolution during dynamic compression of copper
AU  - K. Yan
AU  - Zhaokun Wang
AU  - Haijuan Mei
AU  - Wanting Sun
PY  - 2025
UR  - https://arxiv.org/abs/2504.19248
ID  - 2504.19248
ER  -