TY  - RPRT
TI  - Experimental Observation of Extremely Strong Defect-Phonon Scatterings in Semiconductor Single Crystals
AU  - Zifeng Huang
AU  - Jianbo Liang
AU  - Yuxiang Wang
AU  - Zixuan Sun
AU  - Naoteru Shigekawa
AU  - Ming Li
AU  - Runsheng Wang
AU  - Zhe Cheng
PY  - 2025
UR  - https://arxiv.org/abs/2504.20820
ID  - 2504.20820
ER  -