@misc{indiciae9609f1aa5b52,
  title = {Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures: An Evaluation via Terahertz Emission Spectroscopy (TES)},
  author = {Dongxun Yang and Tonouchi Masayoshi},
  year = {2025},
  doi = {10.1142/s0129156424400184},
  url = {https://arxiv.org/abs/2504.21265},
  note = {Source identifier: 2504.21265}
}