TY  - RPRT
TI  - Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures: An Evaluation via Terahertz Emission Spectroscopy (TES)
AU  - Dongxun Yang
AU  - Tonouchi Masayoshi
PY  - 2025
DO  - 10.1142/s0129156424400184
UR  - https://arxiv.org/abs/2504.21265
ID  - 2504.21265
ER  -