TY  - RPRT
TI  - DeCo: Defect-Aware Modeling with Contrasting Matching for Optimizing Task Assignment in Online IC Testing
AU  - Lo Pang-Yun Ting
AU  - Yu-Hao Chiang
AU  - Yi-Tung Tsai
AU  - Hsu-Chao Lai
AU  - Kun-Ta Chuang
PY  - 2025
UR  - https://arxiv.org/abs/2505.00278
ID  - 2505.00278
ER  -