@misc{indiciaeaf9419e6cd50,
  title = {Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC},
  author = {Niels Sorgenfrei and Elias Arnqvist and Yana Gurimskaya and Michael Moll and Ulrich Parzefall and Faiza Rizwan and Moritz Wiehe},
  year = {2025},
  doi = {10.1088/1748-0221/20/07/c07006},
  url = {https://arxiv.org/abs/2505.02671},
  note = {Source identifier: 2505.02671}
}