@misc{indiciae3ff1a8376f01,
  title = {Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing},
  author = {Shruthi Kogileru and Mark McBride and Yaxin Bi and Kok Yew Ng},
  year = {2025},
  doi = {10.1109/indin64977.2025.11279663},
  url = {https://arxiv.org/abs/2505.03576},
  note = {Source identifier: 2505.03576}
}