TY  - RPRT
TI  - Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing
AU  - Shruthi Kogileru
AU  - Mark McBride
AU  - Yaxin Bi
AU  - Kok Yew Ng
PY  - 2025
DO  - 10.1109/indin64977.2025.11279663
UR  - https://arxiv.org/abs/2505.03576
ID  - 2505.03576
ER  -