TY  - RPRT
TI  - Assessing the connection between galactic conformity and assembly-type bias
AU  - Ivan Lacerna
AU  - Nelson Padilla
AU  - Daniela Palma
PY  - 2025
DO  - 10.1051/0004-6361/202555329
UR  - https://arxiv.org/abs/2505.03880
ID  - 2505.03880
ER  -