@misc{indiciae92740fca6dce,
  title = {Investigation of Low Frequency Noise in CryoCMOS devices through Statistical Single Defect Spectroscopy},
  author = {Edoardo Catapano and Anirudh Varanasi and Philippe Roussel and Robin Degraeve and Yusuke Higashi and Ruben Asanovski and Ben Kaczer and Javier Diaz Fortuny and Michael Waltl and Valeri Afanasiev and Kristiaan De Greve and Alexander Grill},
  year = {2025},
  url = {https://arxiv.org/abs/2505.04030},
  note = {Source identifier: 2505.04030}
}