TY  - RPRT
TI  - Defect engineering and effect of vacancy concentration on the electrochemical performance of V-based MXenes
AU  - Leiqiang Qin
AU  - Rutuparna Samal
AU  - Jianxia Jiang
AU  - Joseph Halim
AU  - Ningjun Chen
AU  - Florian Chabanais
AU  - Per O. A. Persson
AU  - Johanna Rosen
PY  - 2025
UR  - https://arxiv.org/abs/2505.04226
ID  - 2505.04226
ER  -