@misc{indiciae71b95876e222,
  title = {Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process},
  author = {Gianluca Aglieri Rinella and Nicole Apadula and Anton Andronic and Matias Antonelli and Mauro Aresti and Roberto Baccomi and Pascal Becht and Stefania Beole and Marcello Borri and Justus Braach and Matthew Daniel Buckland and Eric Buschmann and Paolo Camerini and Francesca Carnesecchi and Leonardo Cecconi and Edoardo Charbon and Giacomo Contin and Dominik Dannheim and Joao de Melo and Wenjing Deng and Antonello di Mauro and Jan Hasenbichler and Hartmut Hillemanns and Geun Hee Hong and Artem Isakov and Hangil Jang and Antoine Junique and Minjung Kim and Alex Kluge and Artem Kotliarov and Filip Křížek and Lukas Lautner and Sanghoon Lim and Magnus Mager and Davide Marras and Paolo Martinengo and Silvia Masciocchi and Marius Wilm Menzel and Magdalena Munker and Francesco Piro and Alexandre Rachevski and Karoliina Rebane and Felix Reidt and Roberto Russo and Isabella Sanna and Valerio Sarritzu and Serhiy Senyukov and Walter Snoeys and Jory Sonneveld and Miljenko Šuljić and Peter Svihra and Nicolas Tiltmann and Vittorio Di Trapani and Gianluca Usai and Jacob Bastiaan Van Beelen and Mirella Dimitrova Vassilev and Caterina Vernieri and Anna Villani},
  year = {2025},
  url = {https://arxiv.org/abs/2505.05867},
  note = {Source identifier: 2505.05867}
}