@misc{indiciae5c504a44c8ce,
  title = {Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study},
  author = {Manuel Barusco and Francesco Borsatti and Youssef Ben Khalifa and Davide Dalle Pezze and Gian Antonio Susto},
  year = {2025},
  url = {https://arxiv.org/abs/2505.07576},
  note = {Source identifier: 2505.07576}
}