TY  - RPRT
TI  - Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study
AU  - Manuel Barusco
AU  - Francesco Borsatti
AU  - Youssef Ben Khalifa
AU  - Davide Dalle Pezze
AU  - Gian Antonio Susto
PY  - 2025
UR  - https://arxiv.org/abs/2505.07576
ID  - 2505.07576
ER  -