@misc{indiciae89f2d1ed0859,
  title = {Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES},
  author = {O. V. Pshyk and J. Patidar and C. Cancellieri and S. Siol},
  year = {2025},
  url = {https://arxiv.org/abs/2505.20145},
  note = {Source identifier: 2505.20145}
}