TY  - RPRT
TI  - Decoupling Electric Field and Temperature-Driven Atomistic Forming Mechanisms in TaOx/HfO2-Based ReRAMs using Reactive Molecular Dynamics Simulations
AU  - Simanta Lahkar
AU  - Valeria Bragaglia
AU  - Behnaz Bagheri
AU  - Donato Francesco Falcone
AU  - Matteo Galetta
AU  - Marilyne Sousa
AU  - Aida Todri-Sanial
PY  - 2025
UR  - https://arxiv.org/abs/2505.24468
ID  - 2505.24468
ER  -