TY  - RPRT
TI  - Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps
AU  - Martin Folwarczny
AU  - Ao Li
AU  - Rushvi Shah
AU  - Aaron Chote
AU  - Alexandra C. Austin
AU  - Yimin Zhu
AU  - Gregory S. Rohrer
AU  - Michael A. Jackson
AU  - Souhardh Kotakadi
AU  - Katharina Marquardt
PY  - 2025
UR  - https://arxiv.org/abs/2505.24798
ID  - 2505.24798
ER  -