@misc{indiciae90b51a62da4d,
  title = {Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning},
  author = {Wang WeiQuan and Riaz-ul-Haque Mian},
  year = {2025},
  url = {https://arxiv.org/abs/2506.03556},
  note = {Source identifier: 2506.03556}
}