TY  - RPRT
TI  - Physics-Based Compact Modeling for the Drain Current Variability in Single-Layer Graphene FETs
AU  - N. Mavredakis
AU  - A. Pacheco-Sanchez
AU  - R. Garcia Cortadella
AU  - Anton-Guimerà-Brunet
AU  - J. A. Garrido
AU  - D. Jiménez
PY  - 2025
DO  - 10.1109/ted.2025.3560616
UR  - https://arxiv.org/abs/2506.03732
ID  - 2506.03732
ER  -