TY  - RPRT
TI  - First-principles characterization of native defects and oxygen impurities in GaAs
AU  - Khang Hoang
PY  - 2026
DO  - 10.1088/1361-648x/ae7245
UR  - https://arxiv.org/abs/2506.07954
ID  - 2506.07954
ER  -