TY  - RPRT
TI  - Coercive Field Reduction in Ultra-thin Al1-XScXN via Interfacial Engineering with a Scandium Electrode
AU  - Yinuo Zhang
AU  - Rajeev Kumar Rai
AU  - Giovanni Esteves
AU  - Yubo Wang
AU  - Deep M. Jariwala
AU  - Eric A. Stach
AU  - Roy H. Olsson III
PY  - 2025
UR  - https://arxiv.org/abs/2506.10169
ID  - 2506.10169
ER  -