@misc{indiciae62a9ee660d5a,
  title = {Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection},
  author = {Emílio Dolgener Cantú and Rolf Klemens Wittmann and Oliver Abdeen and Patrick Wagner and Wojciech Samek and Moritz Baier and Sebastian Lapuschkin},
  year = {2025},
  url = {https://arxiv.org/abs/2506.10713},
  note = {Source identifier: 2506.10713}
}