TY  - RPRT
TI  - Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection
AU  - Emílio Dolgener Cantú
AU  - Rolf Klemens Wittmann
AU  - Oliver Abdeen
AU  - Patrick Wagner
AU  - Wojciech Samek
AU  - Moritz Baier
AU  - Sebastian Lapuschkin
PY  - 2025
UR  - https://arxiv.org/abs/2506.10713
ID  - 2506.10713
ER  -