TY  - RPRT
TI  - Free-Space Characterization Setup for Low-loss Aluminum Oxide Waveguides at 261 nm
AU  - Vahram Voskerchyan
AU  - Dawson Bonneville
AU  - Lantian Chang
AU  - S. M. Garcia Blanco
PY  - 2026
UR  - https://arxiv.org/abs/2506.13227
ID  - 2506.13227
ER  -