TY  - RPRT
TI  - Enhancing Gate Control and Mitigating Short Channel Effects in 20-50 nm Channel Length Amorphous Oxide Thin Film Transistors
AU  - Chankeun Yoon
AU  - Juhan Ahn
AU  - Yuchen Zhou
AU  - Jaydeep P. Kulkarni
AU  - Ananth Dodabalapur
PY  - 2026
DO  - 10.1021/acsnano.5c10260
UR  - https://arxiv.org/abs/2506.14156
ID  - 2506.14156
ER  -