TY  - RPRT
TI  - Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering
AU  - Chen Shen
AU  - Honghu Zhang
AU  - Beate Klösgen
AU  - Benjamin M. Ocko
PY  - 2025
DO  - 10.1103/znt1-fmx6
UR  - https://arxiv.org/abs/2506.14672
ID  - 2506.14672
ER  -