TY  - RPRT
TI  - Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing
AU  - Adrian Poniatowski
AU  - Natalie Gentner
AU  - Manuel Barusco
AU  - Davide Dalle Pezze
AU  - Samuele Salti
AU  - Gian Antonio Susto
PY  - 2025
UR  - https://arxiv.org/abs/2506.15260
ID  - 2506.15260
ER  -