@misc{indiciae92405d416ea1,
  title = {Stacking faults from a different angle - Overcoming the edge-on limit in high-resolution defect analysis},
  author = {Nicolas Karpstein and Lukas Müller and Andreas Bezold and Michael J. Mills and Steffen Neumeier and Erdmann Spiecker},
  year = {2026},
  doi = {10.1038/s41467-026-77584-z},
  url = {https://arxiv.org/abs/2506.15510},
  note = {Source identifier: 2506.15510}
}