TY  - RPRT
TI  - Stacking faults from a different angle - Overcoming the edge-on limit in high-resolution defect analysis
AU  - Nicolas Karpstein
AU  - Lukas Müller
AU  - Andreas Bezold
AU  - Michael J. Mills
AU  - Steffen Neumeier
AU  - Erdmann Spiecker
PY  - 2026
DO  - 10.1038/s41467-026-77584-z
UR  - https://arxiv.org/abs/2506.15510
ID  - 2506.15510
ER  -