@misc{indiciae7cafb22f79ab,
  title = {Physical-Layer Signal Injection Attacks on EV Charging Ports: Bypassing Authentication via Electrical-Level Exploits},
  author = {Hetian Shi and Yi He and Shangru Song and Jianwei Zhuge and Jian Mao},
  year = {2025},
  doi = {10.1051/sands/2026012},
  url = {https://arxiv.org/abs/2506.16400},
  note = {Source identifier: 2506.16400}
}