@misc{indiciaef74a4e86eec6,
  title = {From Lab to Factory: Pitfalls and Guidelines for Self-/Unsupervised Defect Detection on Low-Quality Industrial Images},
  author = {Sebastian Hönel and Jonas Nordqvist},
  year = {2025},
  url = {https://arxiv.org/abs/2506.16890},
  note = {Source identifier: 2506.16890}
}