TY  - RPRT
TI  - From Lab to Factory: Pitfalls and Guidelines for Self-/Unsupervised Defect Detection on Low-Quality Industrial Images
AU  - Sebastian Hönel
AU  - Jonas Nordqvist
PY  - 2025
UR  - https://arxiv.org/abs/2506.16890
ID  - 2506.16890
ER  -