TY  - RPRT
TI  - Nanoscale imaging of reduced forward bias at V-defects in green-emitting nitride LEDs
AU  - C. Fornos
AU  - N. Alyabyeva
AU  - W. Y. Ho
AU  - C. Roubert
AU  - T. Tak
AU  - J. S. Speck
AU  - C. Weisbuch
AU  - J. Peretti
AU  - A. C. H. Rowe
PY  - 2026
DO  - 10.1103/x3kp-7nqg
UR  - https://arxiv.org/abs/2506.18025
ID  - 2506.18025
ER  -