TY  - RPRT
TI  - Wide-field Hyperspectral Optical Microscopy for Rapid Characterization of Two-Dimensional Semiconductors and Heterostructures
AU  - Zhenghan Peng
AU  - Adeyemi Uthman
AU  - Zhepeng Zhang
AU  - Anh Tuan Hoang
AU  - Xiang Zhu
AU  - Eric Pop
AU  - Andrew J. Mannix
PY  - 2025
UR  - https://arxiv.org/abs/2506.18342
ID  - 2506.18342
ER  -