TY  - RPRT
TI  - Systematic Biases from ARM-Based Sensitivity and Imaging in Compton Cameras
AU  - Tomonori Ikeda
AU  - Tatsuya Sawano
AU  - Naomi Tsuji
AU  - Yoshitaka Mizumura
PY  - 2025
UR  - https://arxiv.org/abs/2506.18659
ID  - 2506.18659
ER  -