TY  - RPRT
TI  - A Structural Causal Model for Electronic Device Reliability: From Effects to Counterfactuals
AU  - Federico Mattia Stefanini
AU  - Nedka Dechkova Nikiforova
AU  - Rossella Berni
PY  - 2025
UR  - https://arxiv.org/abs/2506.18663
ID  - 2506.18663
ER  -