@misc{indiciae17237b682c81,
  title = {Characterization of WSe\$\_2\$ films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses},
  author = {Tianbi Zhang and Jakub Holzer and Tomáš Vystavěl and Miroslav Kolíbal and Estácio Paiva de Araújo and Chris Stephens and T. Ben Britton},
  year = {2025},
  doi = {10.1021/acsnano.5c10753},
  url = {https://arxiv.org/abs/2506.22575},
  note = {Source identifier: 2506.22575}
}