TY  - RPRT
TI  - Characterization of WSe$_2$ films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses
AU  - Tianbi Zhang
AU  - Jakub Holzer
AU  - Tomáš Vystavěl
AU  - Miroslav Kolíbal
AU  - Estácio Paiva de Araújo
AU  - Chris Stephens
AU  - T. Ben Britton
PY  - 2025
DO  - 10.1021/acsnano.5c10753
UR  - https://arxiv.org/abs/2506.22575
ID  - 2506.22575
ER  -