@misc{indiciae0422eb55e4ce,
  title = {Density functional theory study of effect of NO annealing on electronic structure and carrier-scattering property of 4H-SiC(0001)/SiO\$\_2\$ interface},
  author = {Nahoto Funaki and Kosei Sugiyama and Mitsuharu Uemoto and Tomoya Ono},
  year = {2025},
  url = {https://arxiv.org/abs/2506.23912},
  note = {Source identifier: 2506.23912}
}